Wednesday, June 02, 2010
Session 37: Posters 1
1:30 p.m. - 5:10 p.m.
Committee: Posters
Rivoli B & C
Session Co-Chairs:
Mark Eblen
Kyocera America, Inc.
T +1-858-614-2537
F +1-858-573-0159
mark.eblen@kyocera.com
|
Nam Pham
IBM Corporation
T +1-512-286-8011
F +1-512-973-4240
npham@us.ibm.com
|
Papers:
1. 1:30 PM - High Power and Fine Pitch Assembly Using Solder Anisotropic Conductive Films (ACFs) Combined with Ultrasonic Bonding Technique
Kiwon Lee- KAIST
Kyung Wook Paik- KAIST
2. 1:55 PM - Gold-Gold Interconnects to Copper Pillar Using Fast Thermal Compression Bonding Using Non-Conductive Paste
D. Frye- Henkel Corporation
R. Guino- Henkel Corporation
S. Gupta- Henkel Corporation
M. Sano- Henkel Corporation
K. Sato- Henkel Corporation
K. Iida- Henkel Corporation
3. 2:20 PM - Alternative Patterning Techniques Enabling Fine Pitch Interconnection on Topography Surfaces
F. Iker- IMEC
T. Funaya- NEC Corporation
G. Jamieson- IMEC
E. Beyne- IMEC
4. 3:30 PM - Influence of Bonding Atmosphere on Low-Temperature Wafer Bonding
Ying-Hui Wang- University of Tokyo
Tadatomo Suga- University of Tokyo
5. 3:55 PM - High-Speed Laser Plating on Cu Leadframe Using Ag Nanoparticles
Katsuhiro Maekawa- Ibaraki University
Kazuhiko Yamasaki- Ibaraki University
Tomotake Niizeki- Ibaraki University
Mamoru Mita- Hitachi
Yorishige Matsuba- Harima Chemicals, Inc.
Nobuto Terada- Harima Chemicals, Inc.
Hiroshi Saito- Harima Chemicals, Inc.
6. 4:20 PM - Bonding/Barrier Layers on Bismuth Telluride (Bi2Te3) for High Temperature Applications
Wen P. Lin- University of California, Irvine
Pin J. Wang- University of California, Irvine
Chin C. Lee- University of California, Irvine
7. 4:45 PM - Testing and Prevention of Head-In-Pillow
Yan Liu- Indium Corporation
Pamela Fiacco- Indium Corporation
Ning-Cheng Lee- Indium Corporation