About ECTC
Calendar
Technical Program
Technology Corner
Short Courses
Author Info
Advance Program
Committees
Conference Registration
Hotel Registration
Sheraton New Orleans
City of New Orleans
Contact ECTC
Press Information
Photo Gallery
2003 Program-at-a-glance
2002 Conference Final Program
2002 Conference Proceedings
ECTC Home
06/02/2010

Session 10: Bonding Interconnects
8:00 a.m. - 11:40 a.m.
Committee: Materials & Processing
Champagne 2

Session Co-Chairs:

Dong Wook Kim
Xilinx Corporation
T +1-408-626-6374
F +1-408-559-9237
dongk@xilinx.com
Kyung-Wook Paik
KAIST
T +82-42-350-3335
F +82-42-350-8124
kwpaik@kaist.ac.kr

Papers:

1. 08:00 AM - Near-Eutectic Sn-Ag-Cu Solder Bumps Formation for Flip-Chip Interconnection by Electrodeposition
Yi Qin- Loughborough University
Changqing Liu- Loughborough University
G.D. Wilcox- Loughborough University
Kun Zhao- Heriot-Watt University
Changhai Wang- Heriot-Watt University

2. 08:25 AM - A New Ni-Zn Under Bump Metallurgy for Pb-Free Solder Bump Flip Chip Application
Hae-Yonng Cho- Hanyang University
Tae-Jin Kim- Hanyang University
Young Min Kim- Hanyang University
Sun-Chul Kim- Hanyang University
Jin-Young Park- Hanyang University
Young-Ho Kim- Hanyang University

3. 08:50 AM - Low Temperature Bonding to 304 Stainless Steel for High Temperature Electronic Packages
Chu-Hsuan Sha- University of California, Irvine
Chin C. Lee- University of California, Irvine

4. 10:00 AM - A Synchrotron Micro-Diffraction Investigation of Crystallographic Texture of High-Sn Alloy Films and Its Effects on Whisker Growth
Pylin Sarobol- Purdue University
Aaron Pedigo- Purdue University
John Blendell- Purdue University
Carol Handwerker- Purdue University
Peng Su- Cisco Systems, Inc.
Li Li- Cisco Systems, Inc.
Jie Xue- Cisco Systems, Inc.

5. 10:25 AM - Effect of Ag on Ripening Growth of Cu6Sn5 Grains Formed between Molten Sn-xAg-0.5Cu Solders and Cu
Moon Gi Cho- KAIST, Samsung Electronics
Yong Sung Park- KAIST
Sun-Kyoung Seo- KAIST
Kyung-Wook Paik- KAIST
Hyuck Mo Lee- KAIST

6. 10:50 AM - Effect of Electromigration on Intermetallic Compound Formation in Line-Type Cu/Sn/Cu and Cu/Sn/Ni Interconnects
L.D. Chen- Dalian University of Technology
M.L. Huang- Dalian University of Technology
S.M. Zhou- Dalian University of Technology

7. 11:15 AM - Acceptance Testing of BGA Ball Alloys
Aileen Allen- Hewlett Packard
Gregory Henshall- Hewlett Packard
Kris Troxel- Hewlett Packard
Jian Miremadi- Hewlett Packard
Elizabeth Benedetto- Hewlett Packard
Helen Holder- Hewlett Packard
Michael Roesch- Hewlett Packard


Sponsors:


©2003, ECTC