About ECTC
Calendar
Technical Program
Technology Corner
Short Courses
Author Info
Advance Program
Committees
Conference Registration
Hotel Registration
Sheraton New Orleans
City of New Orleans
Contact ECTC
Press Information
Photo Gallery
2003 Program-at-a-glance
2002 Conference Final Program
2002 Conference Proceedings
ECTC Home
06/02/2010

Session 5: Advances in Predictive Reliability
8:00 a.m. - 11:40 a.m.
Committee: Applied Reliability
Champagne 1

Session Co-Chairs:

Lakshmi N. Ramanathan
Microsoft Corporation
T +1-425 421 3838
F +1-425 936 7329
laramana@microsoft.com
Ephraim Suhir
University of California, Santa Cruz
T +1-650-969-1530
F +1-650-968-4611
suhire@aol.com

Papers:

1. 08:00 AM - Finite Element Based Fatigue Life Prediction for Electronic Components under Random Vibration Loading
Da Yu- Binghamton University
Abdullah Al-Yafawi- Binghamton University
Seungbae Park- Binghamton University
Soonwan Chung- Samsung Electronics

2. 08:25 AM - Mechanical Analysis and Reliability Enhancement of a Proximity Communication Flip Chip Package
Bruce Guenin- Oracle
Jing Shi- Oracle

3. 08:50 AM - Quantification of Micropartial Residual Stress for Mechanical Characterization of TSV through Nanoinstrumented Indentation Testing
Gyujei Lee- Hynix Semiconductor, Inc.
Ho Young Son- Hynix Semiconductor, Inc.
Joon Ki Hong- Hynix Semiconductor, Inc.
Kwang Yoo Byun- Hynix Semiconductor, Inc.
Dongil Kwon- Seoul National University

4. 10:00 AM - Assessment of Residual Damage in Leadfree Electronics Subjected to Multiple Thermal Environments of Thermal Aging and Thermal Cycling
Pradeep Lall- Auburn University
Rahul Vaidya- Auburn University
Vikrant More- Auburn University
Kai Goebel- NASA Ames Research Center
Jeff Suhling- Auburn University

5. 10:25 AM - Full Characterization of Cu/Cu Direct Bonding for 3D Integration
Rachid Taibi- STMicroelectronics
Léa Di Cioccio- CEA LETI-Minatec
Cedrick Chappaz- STMicroelectronics
Laurent-Luc Chapelon- STMicroelectronics
Pierric Gueguen- CEA LETI-Minatec
Jérôme Dechamp- CEA LETI-Minatec
Roland Fortunier- Université de Lyon
Laurent Clavelier- CEA LETI-Minatec

6. 10:50 AM - A Study of Package Warpage for Package on Package (PoP)
Masazumi Amagai- Texas Instruments, Japan
Yutaka Suzuki- Texas Instruments, Japan

7. 11:15 AM - Reliability of Au-Ag Alloy Wire Bonding
Hai Liu- Samsung Semiconductor
Qi Chen- Samsung Semiconductor
Zhenqing Zhao- Samsung Semiconductor
Qian Wang- Samsung Semiconductor
Jianfeng Zeng- Samsung Semiconductor
Jonghyun Chae- Samsung Semiconductor
Jaisung Lee- Samsung Semiconductor


Sponsors:


©2003, ECTC