Technical Program

Wednesday, May 30, 2018

Session 4: Automotive and Harsh Environment Reliability
8:00 AM - 11:40 AM
Committee: Applied Reliability
Room: Nautilus 1 & 2

Session Co-Chairs:

Varughese Mathew
NXP Semiconductors
T +1-512-895-6293
varughese.mathew@nxp.com
Vikas Gupta
Texas Instruments, Inc.
T +1-214-567-3160
gvikas@ti.com

Papers: